Show simple item record

dc.contributor.authorKITTISAK JANGPHANISHen_US
dc.date.accessioned2019-11-13T07:50:16Z
dc.date.available2019-11-13T07:50:16Z
dc.date.issued2019
dc.identifier.urihttp://repository.rmutr.ac.th/123456789/1156
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/1156
dc.description.abstractThis research aims (1) to develop the average control chart (x-chart) using the shape parameter of the Inverse Gaussian distribution by Bayesian Estimation for estimating mean and variance, and (2) to compare the process potential capability (Cp) and the actual process capability index (Cpk) for Monte Carlo simulation with 10,000 replications assuming that the specification is +- 0.001. The result shows that the process potential capability (Cp) and actual process capability index (Cpk) of the Adjusted x-chart using Bayesian Estimation of the shape parameter of the Inverse Gaussian distribution for estimating mean and variance have more capability than the x-chart under the normal distribution when the sample size is less than 30. For the sample size of 30, the two control charts have the indifferent capability process. And, the capability of process in Gravure printing used the Adjusted x-chart have capability of process of customer requirement.en_US
dc.language.isoTHen_US
dc.publisherRajamangala University Of Technology Rattanakosinen_US
dc.subjectAdjusted average control charten_US
dc.subjectInverse Gaussian distributionen_US
dc.subjectBayesian Estimationen_US
dc.titleThe application of Bayesian estimator’s the shape parameter of The Inverse Gaussian Distribution for The Adjusted Average Control Charten_US
dc.title.alternativeการประยุกต์ตัวประมาณแบบเบส์ของพารามิเตอร์รูปร่างของการแจกแจงอินเวอร์สเกาส์เซียนในการปรับแผนภูมิควบคุมค่าเฉลี่ยen_US
dc.typeResearchen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record